National Institute of Standards and Technology
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Test case 199233

Description

Defect Type: Dynamic memory defects
Defect Sub-type: Dynamic buffer overrun
Created on: Sep 27, 2012
Author: caesaru01
The test case contains coincidental weaknesses along with intended ones as follows for file buffer_overrun_dynamic.c:
* line(s): 145,151,153,173,434,511,513,550,558 CWE-476
* line(s): 332 CWE-121
* line(s): 476,492 CWE-704
* line(s): 495 CWE-468
* line(s): 606 CWE-823

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