Description
Defect Type: Concurrency defects
Defect Sub-type: Double release
Description: Defect Free Code to identify false positives in double release - concurrency defects
The test case contains coincidental weaknesses along with intended ones as follows for file double_release.c:
* line(s): 24,25,48,68,69,101,120,121,149,168,169,196,217,218,245,263,264,287 CWE-561
Flaws
Test Suites
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