National Institute of Standards and Technology
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Test case 199252


Defect Type: Dynamic memory defects
Defect Sub-type: Deletion of data structure sentinel
Description: Defect Free Code to identify false positives while deletion of data structure sentinel
The test case contains coincidental weaknesses along with intended ones as follows for file deletion_of_data_structure_sentinel.c:
* line(s): 25 CWE-476


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