Defect Type: Stack related defects Defect Sub-type: Stack underrun Description: Defect Free Code to identify false positives in stack underrun conditions The test case contains coincidental weaknesses along with intended ones as follows for file st_underrun.c: * line(s): 51,235,237 CWE-124 * line...

Defect Type: Stack related defects Defect Sub-type: Stack underrun The test case contains coincidental weaknesses along with intended ones as follows for file st_underrun.c: * line(s): 25,51,92,130,150,193 CWE-835 * line(s): 193,195,204 CWE-121 * line(s): 195,227 CWE-124 * line(s): 247 CWE-561

Defect Type: Stack related defects Defect Sub-type: Stack overflow Description: Defect Free Code to identify false positives in stack overflow conditions

Defect Type: Stack related defects Defect Sub-type: Stack overflow

Defect Type: Stack related defects Defect Sub-type: Cross thread stack access Description: Defect Free Code to identify false positives in cross thread access

Defect Type: Stack related defects Defect Sub-type: Cross thread stack access

Defect Type: Concurrency defects Defect Sub-type: Long lock Description: Defect Free Code to identify false positives of long lock conditions

Defect Type: Concurrency defects Defect Sub-type: Long lock

Defect Type: Numerical defects Defect Sub-type: Integer sign lost because of unsigned cast Description: Defect Free Code to identify false positives in losing sign due to cast

Defect Type: Numerical defects Defect Sub-type: Integer sign lost because of unsigned cast

Defect Type: Resource management defects Defect Sub-type: Return of a pointer to a local variable Description: Defect Free Code to identify false positives in return of local variables

Defect Type: Resource management defects Defect Sub-type: Return of a pointer to a local variable

Defect Type: Inappropriate code Defect Sub-type: Redundant conditions Description: Defect Free Code to identify false positives in redundant condition

Defect Type: Inappropriate code Defect Sub-type: Redundant conditions

Defect Type: Concurrency defects Defect Sub-type: Race condition Description: Defect Free Code to identify false positives in race condition The test case contains coincidental weaknesses along with intended ones as follows for file race_condition.c: * line(s): 38,55 CWE-362

Defect Type: Concurrency defects Defect Sub-type: Race condition The test case contains coincidental weaknesses along with intended ones as follows for file race_condition.c: * line(s): 30,88,136,210,284,353 CWE-362

Defect Type: Pointer related defects Defect Sub-type: Incorrect pointer arithmetic Description: Defect Free Code to identify false positives in pointer arithmetic subtraction The test case contains coincidental weaknesses along with intended ones as follows for file ptr_subtraction.c: * line(s): ...

Defect Type: Pointer related defects Defect Sub-type: Incorrect pointer arithmetic

Defect Type: Numerical defects Defect Sub-type: Power related errors Description: Defect Free Code to identify false positives in power related errors The test case contains coincidental weaknesses along with intended ones as follows for file pow_related_errors.c: * line(s): 149,150,151,152 CWE-4...

Defect Type: Numerical defects Defect Sub-type: Power related errors The test case contains coincidental weaknesses along with intended ones as follows for file pow_related_errors.c: * line(s): 154,155,157,158 CWE-476 * line(s): 161 CWE-189

Defect Type: Dynamic memory defects Defect Sub-type: Memory copy at overlapping areas Description: Defect Free Code to identify false positives in memory copy at overlapping areas

Defect Type: Dynamic memory defects Defect Sub-type: Memory copy at overlapping areas

Defect Type: Static memory defects Defect Sub-type: Static buffer overrun Description: Defect Free Code to identify false positives in static buffer overrun The test case contains coincidental weaknesses along with intended ones as follows for file overrun_st.c: * line(s): 22,33,45,56,67,78,89,10...

Defect Type: Static memory defects Defect Sub-type: Static buffer overrun The test case contains coincidental weaknesses along with intended ones as follows for file overrun_st.c: * line(s): 22,33,45,56,67,78,89,100,111,170,183,195,207,223,251,265,281,294,307,321,334,347,360,373,388,403,429,444,4...

Defect Type: Pointer related defects Defect Sub-type: Dereferencing a NULL pointer Description: Defect Free Code to identify false positives in deferencing Null Pointer The test case contains coincidental weaknesses along with intended ones as follows for file null_pointer.c: * line(s): 258,284,2...