Defect Type: Pointer related defects Defect Sub-type: Free NULL pointer Description: Defect Free Code to identify false positives while freeing null pointer The test case contains coincidental weaknesses along with intended ones as follows for file free_null_pointer.c: * line(s): 83,92,118,153,1...

Defect Type: Pointer related defects Defect Sub-type: Free NULL pointer The test case contains coincidental weaknesses along with intended ones as follows for file free_null_pointer.c: * line(s): 54,74,109,144,146,151,241,275,281,282,320,452,483,530,531,532 CWE-476 * line(s): 102,124,167,195,215...

Defect Type: Resource management defects Defect Sub-type: Free non dynamically allocated memory Description: Defect Free Code to identify false positives while freeing non dynamically allocated memory The test case contains coincidental weaknesses along with intended ones as follows for file free...

Defect Type: Resource management defects Defect Sub-type: Free non dynamically allocated memory The test case contains coincidental weaknesses along with intended ones as follows for file free_nondynamic_allocated_memory.c: * line(s): 82,208 CWE-476 * line(s): 114,127,140 CWE-835

Defect Type: Misc defects Defect Sub-type: Unintentional end less loop Description: Defect Free Code to identify false positives in unintentional endless looping

Defect Type: Misc defects Defect Sub-type: Unintentional end less loop The test case contains coincidental weaknesses along with intended ones as follows for file endless_loop.c: * line(s): 24,41,57,74,95,111,133,150,166 CWE-190 * line(s): 26,43,59,76,97,113,135,152,169 CWE-561

Defect Type: Concurrency defects Defect Sub-type: Double release Description: Defect Free Code to identify false positives in double release - concurrency defects The test case contains coincidental weaknesses along with intended ones as follows for file double_release.c: * line(s): 24,25,48,68,6...

Defect Type: Concurrency defects Defect Sub-type: Double release The test case contains coincidental weaknesses along with intended ones as follows for file double_release.c: * line(s): 24,25,50,70,71,101,118,119,147,164,165,192,213,214,241,260,261,288 CWE-561

Defect Type: Concurrency defects Defect Sub-type: Double lock Description: Defect Free Code to identify false positives in double lock - concurrency defects

Defect Type: Concurrency defects Defect Sub-type: Double lock

Defect Type: Resource management defects Defect Sub-type: Double free Description: Defect Free Code to identify false positives in double free - resource management defects The test case contains coincidental weaknesses along with intended ones as follows for file double_free.c: * line(s): 36,55,...

Defect Type: Resource management defects Defect Sub-type: Double free The test case contains coincidental weaknesses along with intended ones as follows for file double_free.c: * line(s): 37,78 CWE-476 * line(s): 88 CWE-401

Defect Type: Dynamic memory defects Defect Sub-type: Deletion of data structure sentinel Description: Defect Free Code to identify false positives while deletion of data structure sentinel The test case contains coincidental weaknesses along with intended ones as follows for file deletion_of_data...

Defect Type: Dynamic memory defects Defect Sub-type: Deletion of data structure sentinel Description: Defect Code to identify defects while deletion of data structure sentinel The test case contains coincidental weaknesses along with intended ones as follows for file deletion_of_data_structure_se...

Defect Type: Concurrency defects Defect Sub-type: Dead lock Description: Defect Free Code to identify false positives in dead lock conditions

Defect Type: Concurrency defects Defect Sub-type: Dead lock

Defect Type: Inappropriate code Defect Sub-type: Dead code Description: Defect Free Code to identify false positives in dead code

Defect Type: Inappropriate code Defect Sub-type: Dead code Description: Defect Code to identify defects in dead code

Defect Type: Numerical defects Defect Sub-type: Data underflow Description: Defect Free Code to identify false positives in data underflow in static declaration

Defect Type: Numerical defects Defect Sub-type: Data underflow Description: Defect Code to identify defects in data underflow in static declaration

Defect Type: Numerical defects Defect Sub-type: Data overflow Description: Defect Free Code to identify false positives in data overflow in static declaration

Defect Type: Numerical defects Defect Sub-type: Data overflow Description: Defect Code to identify defects in data overflow in static declaration

Defect Type: Numerical defects Defect Sub-type: Integer precision lost because of cast Description: Defect Free Code to identify false positives in data lost at cast

Defect Type: Numerical defects Defect Sub-type: Integer precision lost because of cast Description: Defect Code to identify defects in data lost at cast

Defect Type: Inappropriate code Defect Sub-type: Contradict conditions Description: Defect Free Code to identify false positives occurring in contradicting conditions The test case contains coincidental weaknesses along with intended ones as follows for file conflicting_cond.c: * line(s): 104 CWE...