Description
Defect Type: Static memory defects
Defect Sub-type: Static buffer overrun
The test case contains coincidental weaknesses along with intended ones as follows for file overrun_st.c:
* line(s): 22,33,45,56,67,78,89,100,111,170,183,195,207,223,251,265,281,294,307,321,334,347,360,373,388,403,429,444,458,472,490,503,523,539,557,572,591,633,649,665,696,707 CWE-121
Flaws
Test Suites
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