National Institute of Standards and Technology
Package illustrating a test case

Test case 199233


Defect Type: Dynamic memory defects
Defect Sub-type: Dynamic buffer overrun
Created on: Sep 27, 2012
Author: caesaru01
The test case contains coincidental weaknesses along with intended ones as follows for file buffer_overrun_dynamic.c:
* line(s): 145,151,153,173,434,511,513,550,558 CWE-476
* line(s): 332 CWE-121
* line(s): 476,492 CWE-704
* line(s): 495 CWE-468
* line(s): 606 CWE-823


Test Suites

Have any comments on this test case? Please, send us an email.