National Institute of Standards and Technology
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Test case 199234


Defect Type: Dynamic memory defects
Defect Sub-type: Dynamic buffer overrun
Description: Defect Free Code to identify false positives in dynamic buffer overrun
Created on: Sep 27, 2012
Author: caesaru01
The test case contains coincidental weaknesses along with intended ones as follows for file buffer_overrun_dynamic.c:
* line(s): 433,510,512,549,557 CWE-476
* line(s): 475,491 CWE-704
* line(s): 494 CWE-468


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