Description
Defect Type: Dynamic memory defects
Defect Sub-type: Dynamic buffer underrun
Created on: Sep 27, 2012
Author: caesaru01
The test case contains coincidental weaknesses along with intended ones as follows for file buffer_underrun_dynamic.c:
* line(s): 148,154,177,516,518,550,558,668,673,678 CWE-476
* line(s): 159 CWE-401
* line(s): 177,221 CWE-468
* line(s): 482,498 CWE-704
* line(s): 620,673 CWE-124
Flaws
Test Suites
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