Defect Type: Dynamic memory defects
Defect Sub-type: Dynamic buffer underrun
Description: Defect Free Code to identify false positives in buffer underrun in dynamic memory allocation
Created on: Sep 27, 2012
The test case contains coincidental weaknesses along with intended ones as follows for file buffer_underrun_dynamic.c:
* line(s): 145,151,173,512,514,547,555,669,674,679 CWE-476
* line(s): 478,494 CWE-704
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