Defect Type: Concurrency defects Defect Sub-type: Double release The test case contains coincidental weaknesses along with intended ones as follows for file double_release.c: * line(s): 24,25,50,70,71,101,118,119,147,164,165,192,213,214,241,260,261,288 CWE-561

Defect Type: Concurrency defects Defect Sub-type: Double lock Description: Defect Free Code to identify false positives in double lock - concurrency defects

Defect Type: Concurrency defects Defect Sub-type: Double lock

Defect Type: Resource management defects Defect Sub-type: Double free Description: Defect Free Code to identify false positives in double free - resource management defects The test case contains coincidental weaknesses along with intended ones as follows for file double_free.c: * line(s): 36,55,...

Defect Type: Resource management defects Defect Sub-type: Double free The test case contains coincidental weaknesses along with intended ones as follows for file double_free.c: * line(s): 37,78 CWE-476 * line(s): 88 CWE-401

Defect Type: Dynamic memory defects Defect Sub-type: Deletion of data structure sentinel Description: Defect Free Code to identify false positives while deletion of data structure sentinel The test case contains coincidental weaknesses along with intended ones as follows for file deletion_of_data...

Defect Type: Dynamic memory defects Defect Sub-type: Deletion of data structure sentinel Description: Defect Code to identify defects while deletion of data structure sentinel The test case contains coincidental weaknesses along with intended ones as follows for file deletion_of_data_structure_se...

Defect Type: Concurrency defects Defect Sub-type: Dead lock Description: Defect Free Code to identify false positives in dead lock conditions

Defect Type: Concurrency defects Defect Sub-type: Dead lock

Defect Type: Inappropriate code Defect Sub-type: Dead code Description: Defect Free Code to identify false positives in dead code

Defect Type: Inappropriate code Defect Sub-type: Dead code Description: Defect Code to identify defects in dead code

Defect Type: Numerical defects Defect Sub-type: Data underflow Description: Defect Free Code to identify false positives in data underflow in static declaration

Defect Type: Numerical defects Defect Sub-type: Data underflow Description: Defect Code to identify defects in data underflow in static declaration

Defect Type: Numerical defects Defect Sub-type: Data overflow Description: Defect Free Code to identify false positives in data overflow in static declaration

Defect Type: Numerical defects Defect Sub-type: Data overflow Description: Defect Code to identify defects in data overflow in static declaration

Defect Type: Numerical defects Defect Sub-type: Integer precision lost because of cast Description: Defect Free Code to identify false positives in data lost at cast

Defect Type: Numerical defects Defect Sub-type: Integer precision lost because of cast Description: Defect Code to identify defects in data lost at cast

Defect Type: Inappropriate code Defect Sub-type: Contradict conditions Description: Defect Free Code to identify false positives occurring in contradicting conditions The test case contains coincidental weaknesses along with intended ones as follows for file conflicting_cond.c: * line(s): 104 CWE...

Defect Type: Inappropriate code Defect Sub-type: Contradict conditions The test case contains coincidental weaknesses along with intended ones as follows for file conflicting_cond.c: * line(s): 26,45,64,85,120,139,159,179 CWE-561

Defect Type: Pointer related defects Defect Sub-type: Comparison NULL with function pointer Description: Defect Free Code to identify false positives while comparison of NULL with function pointers The test case contains coincidental weaknesses along with intended ones as follows for file cmp_fun...

Defect Type: Pointer related defects Defect Sub-type: Comparison NULL with function pointer The test case contains coincidental weaknesses along with intended ones as follows for file cmp_funcadr.c: * line(s): 28,50 CWE-561

Defect Type: Dynamic memory defects Defect Sub-type: Dynamic buffer underrun Description: Defect Free Code to identify false positives in buffer underrun in dynamic memory allocation Created on: Sep 27, 2012 Author: caesaru01 The test case contains coincidental weaknesses along with intended ones...

Defect Type: Dynamic memory defects Defect Sub-type: Dynamic buffer underrun Created on: Sep 27, 2012 Author: caesaru01 The test case contains coincidental weaknesses along with intended ones as follows for file buffer_underrun_dynamic.c: * line(s): 148,154,177,516,518,550,558,668,673,678 CWE-476...

Defect Type: Dynamic memory defects Defect Sub-type: Dynamic buffer overrun Description: Defect Free Code to identify false positives in dynamic buffer overrun Created on: Sep 27, 2012 Author: caesaru01 The test case contains coincidental weaknesses along with intended ones as follows for file bu...

Defect Type: Dynamic memory defects Defect Sub-type: Dynamic buffer overrun Created on: Sep 27, 2012 Author: caesaru01 The test case contains coincidental weaknesses along with intended ones as follows for file buffer_overrun_dynamic.c: * line(s): 145,151,153,173,434,511,513,550,558 CWE-476 * lin...